An analytical model of label-free nanoscale chemical imaging reveals avenues toward improved spatial resolution and sensitivity

Proceedings of the National Academy of Sciences, Volume 122, Issue 4, January 2025.
SignificanceAtomic force microscopy–infrared spectroscopy (AFM-IR) is a widely used scanning probe technique for label-free photothermal nanoscale chemical imaging, with diverse applications spanning single protein spectroscopy to analyzing nanoscale …
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